Overview
Agilent’s multipurpose scanners
deliver unsurpassed performance,
versatility, and ease of use for atomic
force microscopy (AFM). They are
ideal for imaging in ? uids or air and
under controlled temperature and
environmental conditions.
These unique top-down scanners
offer many key performance bene? ts.
To deliver high-resolution imaging
results, a patented pendulum
scanner design is utilized that
eliminates artifacts in the image
by keeping the relative position of
the laser spot ? xed in relation to
the cantilever throughout the scan
cycle. The top-down con? guration
provides complete isolation of the
scanning elements and electronics
from the imaging environment, thus
allowing total environmental control,
? uid-friendly operation, and superior
thermal stability. As a result, samples
can be imaged at temperatures up
to 250° C over time periods as long
as 10 hours.